Capabilities
Radiation Effects Testing
- Co-60, Cs-137, Neutron, Flash X-Ray/Prompt Dose Capabilities
- Irradiation and Device Testing per MIL-STD-750E and MIL-STD-883G, Method 1019
- Enhanced Low Dose Radiation Sensitivity (ELDRS) Testing
- Radiation Lot Acceptance Testing (RLAT)
- Focal Plane Array Radiation, Characterization and Testing
- Radiation Engineering and Component Qualification Planning
- Wafer Lot Radiation Screening, Characterization, and Qualification
- MIL-STD-750E and MIL-STD-883G Screening and Qualification of Advanced COTS Devices
- Design Engineering for Radiation Hardened Devices
Assembly
- Quick-Turn 24-hour Prototype IC Assembly
- Chip Removal and Re-assembly for Radiation Testing
- Backside Chip Thinning and Re-assembly for Heavy Ion Radiation Testing
- PC Board Design, Quick-Turn Prototyping and Assembly
- Laser Marking and Cutting
Copyright © 2008 by Radiation Assured Devices Inc. All rights reserved.