Press Releases

16 April 2009
Radiation Assured Devices™ (RAD) Develops Production Process to Perform Backside Thinning on Integrated Circuits (ICs) within 50-microns of the Topside of Die

25 November 2008
Radiation Assured Devices™ (RAD) Installs an Additional IC Wire-Bonder Capable of Bonding Down to a 35-micron Wire Pitch

06 October 2008
Radiation Assured Devices™ (RAD) Completes Capacity Enhancement of their MIL-STD Compliant Cobalt-60 Total Ionizing Dose (TID) and Enhanced Low Dose Rate Sensitivity (ELDRS) Facilities

06 August 2008
Radiation Assured Devices™ (RAD) Installs an Additional Cobalt-60 Irradiation Source for Increased Capacity in Performing Total Ionizing Dose (TID) and Enhanced Low Dose Rate Sensitivity (ELDRS) Integrated Circuit (IC) and Electronic Systems Testing

14 July 2008
Radiation Assured Devices™ (RAD) Awarded DSCC Commercial Lab Suitability for MIL-STD-750 for Seven Test Methods for Testing Discrete Components

11 July 2008
Radiation Assured Devices™ (RAD) Becomes the First and Only Private Sector Laboratory to Obtain DSCC Commercial Lab Suitability Status for Performing Total Dose Irradiation Testing on Discrete Components

1 July 2008
Radiation Assured Devices™ (RAD) is Awarded Small Business Innovative Research (SBIR) Contract to Develop Sensor Test Capability Based on the Nuclear Infrared Clutter Simulation (NICS) System

27 June 2008
Radiation Assured Devices™ (RAD) CTO Joseph M. Benedetto Ph.D. to host Short Course on Single Event Functional Interrupts (SEFIs) in COTS SDRAMs at 2008 IEEE Nuclear and Space Radiation Effects Conference (NSREC) on 14 July 2008 in Tucson, Arizona

17 June 2008
Radiation Assured Devices™ (RAD) now offers Extended Total Ionizing Dose (TID) and Enhanced Low Dose Rate Sensitivity (ELDRS) Integrated Circuit (IC) and Systems Testing at Low Dose Rates of 100, 10 or 1 mrad per second